School of Paper and Plant Resources Engineering (Key Labs) - Leica's Electron Microscope Sample Preparation Technology Exchange Notice
With the improvement of scientific research level, scanning electron microscope and transmission electron microscope have become the conventional equipment for scientific research in related fields, and excellent preparation methods and techniques for electron microscope samples are the prerequisite for obtaining high-quality electron microscope images. In order to better solve the researcher's difficulties and problems in the sample preparation process, the College (Key Laboratory) invites Leica company technical experts to hold electro-optical sample preparation technology exchange meetings. Teachers and students interested in the program are welcome to attend.
Meeting schedule:
Time | Contents | Adress | |
2017.06.27 | 09:00 – 09:30 | 签到 | 2号教学楼A320 |
09:30 – 10:30 | 徕卡电镜制样产品线简单介绍 | ||
10:35 – 10:45 | 茶歇 | ||
10:45 – 12:00 | 超薄切片技术在材料科学领域的应用 | ||
14:00 – 15:00 | 离子束切割/抛光技术在材料科学领域的应用 | ||
15:00 – 15:15 | 茶歇 | ||
15:15 – 16:30 | 徕卡精研一体机TXP在材料科学领域的应用 | ||
16:30 – 17:00 | 样品收集交流及预处理 | ||
2017.06.28 | 上午9:00 – | 超薄切片机UC7参观上机 | 2号教学楼B108 |
下午14:00– | 精研一体机TXP参观上机 | ||
2017.06.29 | 全天 | 超薄切片机UC7/精研一体机TXP参观上机 | |
Leica company technical experts:
Xie Peisong, master degree, graduated from the College of Biological Science and Technology of Yangzhou University, worked in the Institute of Neuroscience, Chinese Academy of Sciences, engaged in electron microscopy related work. He joined Leica Instrument Co., Ltd. in 2010 and has been working on ultra-thin sections for more than 10 years. He has experience in ultrathin slicing of thousands of samples. In this conference, Xie Gong lectured on the application of ultra-thin sections in the field of materials, and also introduced Leica's other new sample preparation technologies. The company's other technical personnel, colleges (key laboratories), and analysts and test centers related to practical work are welcome. Carry on-site sample exchange and sample preparation.
2017.6.22
