On June 27 and 28, 2017, our institute (Key Lab) and Leica Company jointly organized the Electron Microscope Sample Preparation Technology Exchange Conference. Leica's technicians have conducted in-depth exchanges and interactions with the teachers and students of our school in the technology of sample preparation.
Exchange activities include expert reports and on-site operations in two parts. On the morning of the 27th, at the A320 teaching building No. 2, the Leica company's Xie Pei Song engineers made a special report on the technique of electro-microscope sample preparation for teachers and students. The report mainly included pre-processing and preparation of samples for plants and materials science. Characterize the effects of the results and introduce Leica's various sample preparation equipment. On the afternoon of the 27th and 28th, the site visited and operated on the machine to demonstrate to the teachers and students the operation of the Leica Ultra Thin Slicer and the Leica Compact All-in-One. Successfully prepared various samples such as paper samples, leather, and graphene, and answered questions. Many teachers have doubts and difficulties in the preparation of electron microscopy samples.
With the improvement of scientific research level, scanning electron microscope and transmission electron microscope have become the conventional equipment for scientific research in related fields, and excellent preparation methods and techniques for electron microscope samples are prerequisites for obtaining high-quality electron microscope images. It is a great help for researchers to solve the difficulties and problems in the sample preparation process. Electron microscopy image is a section scanning electron microscope image observed after general processing and embedding of the sample.
